X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.3 277 0.1 M Tris, pH 7.3, 0.2 M magnesium chloride, 2.2 M sodium chloride
Unit Cell:
a: 117.266 Å b: 112.503 Å c: 63.222 Å α: 90.000° β: 116.743° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.62 Solvent Content: 52.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.10055713817 39.8491142852 41865 2091 98.1065310618 0.210363055247 0.264217070077 31.6552227129
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 39.85 98.13 0.09119 ? 11.74 3.9 ? 42637 ? ? 30.2473095888
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.101 2.176 ? ? ? 2.49 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97857 APS 21-ID-F
Software
Software Name Purpose Version
HKL-2000 data scaling 1.11.1_2575
PHENIX refinement 1.11.1_2575
MOLREP phasing .
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