X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 8-10% PEG3350, 100mM NaAc 5.0, 100mM tacsimate 5.0, 5mM DTT
Unit Cell:
a: 64.756 Å b: 65.406 Å c: 75.789 Å α: 96.420° β: 92.240° γ: 105.030°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 2.5000 41.6530 39515 1636 95.9800 0.2397 0.2774 83.5588
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 95.95 ? ? 21.076 3.7 ? 39530 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.5 2.57 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL18U1 0.97915 SSRF BL18U1
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
PDB_EXTRACT data extraction 3.27
HKL-2000 data reduction .
HKL-2000 data scaling .
SHARP phasing .