X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 300.0 0.1 M HEPES pH 7.5, 2.0 M Ammonium formate
Unit Cell:
a: 126.285 Å b: 126.285 Å c: 177.247 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 4
Crystal Properties:
Matthew's Coefficient: 3.04 Solvent Content: 59.50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.7000 30.0200 37904 2056 99.9600 0.2579 0.3362 49.3934
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.700 30.020 100.000 0.154 ? 3.800 7.000 ? 37909 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.700 2.800 100.000 ? ? ? 6.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NFPSS BEAMLINE BL19U1 0.978 NFPSS BL19U1
Software
Software Name Purpose Version
HKL-2000 data scaling .
PHENIX refinement 1.18.2_3874
PDB_EXTRACT data extraction 3.27
HKL-2000 data reduction .
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