X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 296 0.09M Ammonium acetate, 0.045M Sodium citrate tribasic dihydrate pH 5.6, 13.5%w/v PEG 4000, 4% PEG P400, 5mM TECP
Unit Cell:
a: 36.720 Å b: 40.737 Å c: 72.937 Å α: 77.220° β: 84.380° γ: 89.960°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.832 38.48 67424 3376 93.56 0.2031 0.2490 36.37
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.832 39.719 93.5 0.069 ? 7.75 1.69 ? 67455 ? -3 30.501
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.84 1.94 93 ? ? 1.23 1.65 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.979081 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
XDS data reduction .
PDB_EXTRACT data extraction 3.25
XDS data scaling .
PHENIX phasing 1.13_2998