X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 26-29% (v/v) polyethylene glycol 3350, 0.10M Bis-Tris HCl
Unit Cell:
a: 133.929 Å b: 80.229 Å c: 135.159 Å α: 90.000° β: 108.533° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.05 Solvent Content: 39.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.1697752983 45.0443856263 140574 7265 97.6269350168 0.182641334888 0.235222273643 31.2130249912
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.16977 45.0444 97.61 0.109 ? 8.48 3.5 ? 141327 ? ? 29.0333207286
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.17 2.248 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL32XU 0.979400 SPring-8 BL32XU
Software
Software Name Purpose Version
XDS data reduction .
XDS data scaling .
pointless data scaling 1.11.6
Aimless data scaling 0.5.32
PHASER phasing 2.7.17
Coot model building 0.8.9.2
PHENIX refinement 1.11.1
Feedback Form
Name
Email
Institute
Feedback