X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 277 20% (w/v) polyethylene glycol 3350 (PEG 3350) as a precipitant and 100 mM MES-NaOH
Unit Cell:
a: 96.600 Å b: 96.600 Å c: 91.100 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 4.50 Solvent Content: 72.65
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 3.3010 24.5740 35663 1159 83.4300 0.3534 0.4084 173.6410
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.30 25 100.0 ? ? 2.67 62.3 ? 35663 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
FREE ELECTRON LASER SLAC LCLS BEAMLINE CXI 1.0000 SLAC LCLS CXI
Software
Software Name Purpose Version
CrystFEL data reduction .
PHENIX refinement DEV-3318
PDB_EXTRACT data extraction 3.27
CrystFEL data scaling .
PHENIX phasing .
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