X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.6 293 15% PEG 3350, 0.2MTri-Sodium Citrate Tris pH 8.6
Unit Cell:
a: 87.670 Å b: 87.670 Å c: 128.482 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 3.99 Solvent Content: 69.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.5 30 8341 ? 78.33 0.2178 0.2632 41.28
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 30 99.9 0.125 ? 21.879 16.5 ? 10649 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.59 100 ? ? 2.16 14.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL19U1 0.97930 SSRF BL19U1
Software
Software Name Purpose Version
PHENIX refinement 1.16-3549
HKL-3000 data reduction .
HKL-3000 data scaling .
HKL2Map phasing .