X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 291 4M Potassium formate, 0.1M BIS-TRIS propane, pH 9.0, 2% w/v Polyethylene glycol monomethyl ether 2000
Unit Cell:
a: 43.726 Å b: 50.310 Å c: 69.134 Å α: 73.876° β: 89.940° γ: 82.552°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.72 Solvent Content: 54.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.50 26.82 81130 3952 90.29 0.1773 0.1903 19.09
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.39 50.00 91.7 ? ? 30.265 3.4 ? 103766 ? ? 13.87
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.39 1.41 ? ? ? ? 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL19U1 0.97919 SSRF BL19U1
Software
Software Name Purpose Version
PHENIX refinement 1.16_3549
HKL-3000 data reduction .
HKL-3000 data scaling .
PHASER phasing .