X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 0.1M Na-acetate pH 4.6, 0.1M Ammonium acetate, 33% PEG 4000
Unit Cell:
a: 109.597 Å b: 109.597 Å c: 59.895 Å α: 90.0° β: 90.0° γ: 120.0°
Symmetry:
Space Group: H 3
Crystal Properties:
Matthew's Coefficient: 2.69 Solvent Content: 54.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.50 24.0994377539 42466 2011 98.9906524628 0.175029741535 0.205890288013 25.7195642734
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.50 50.00 99.2 0.046 ? 32.7 3.1 ? 42470 ? ? 17.1434013931
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.53 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 5C (4A) 0.9795 PAL/PLS 5C (4A)
Software
Software Name Purpose Version
HKL-2000 data processing .
PHENIX refinement 1.9_1692
Coot model building .
HKL-2000 data reduction .
HKL-2000 data scaling .
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