X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 289 0.1M Bis-Tris pH7.2 36% PEG8000
Unit Cell:
a: 102.867 Å b: 102.867 Å c: 65.908 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62
Crystal Properties:
Matthew's Coefficient: 2.59 Solvent Content: 52.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.20042955034 24.7078541962 18868 953 93.0512403215 0.188526221083 0.230901236109 31.9609593147
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.20 24.71 93.1 0.058 ? 2.79 5 ? 18868 ? ? 25.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.2 10 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL18U1 0.987 SSRF BL18U1
Software
Software Name Purpose Version
PHENIX refinement 1.12_2829
HKL-3000 data reduction .
HKL-3000 data scaling .
PHENIX phasing .
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