X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 298 0.1M NaAcetate, 30% w/v PEG400, 0.2M CaAcetate
Unit Cell:
a: 96.630 Å b: 96.630 Å c: 112.680 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 4.35 Solvent Content: 71.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5500 48.3100 20221 1011 99.5400 0.2266 0.2512 92.7794
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.550 48.310 99.900 0.191 ? 12.050 20.164 ? 20297 ? ? 83.077
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.550 2.620 99.900 ? ? 1.270 21.144 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.999859 SLS X10SA
Software
Software Name Purpose Version
XDS data reduction VERSION Jan 31, 2020 BUILT=20200417
XSCALE data scaling VERSION Jan 31, 2020 BUILT=20200417
PHASER phasing 2.8.3
PHENIX refinement 1.18-3855
PDB_EXTRACT data extraction 3.25
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