X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1M Tris/HCl pH 8.5, 27% w/v PEG 4000, 0.2M MgCl2*6H20, 1mM MnCl2
Unit Cell:
a: 40.471 Å b: 55.010 Å c: 89.990 Å α: 81.380° β: 86.360° γ: 89.950°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 36.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.7000 88.7900 18487 1012 92.7100 0.2326 0.2705 30.0980
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 88.790 92.8 ? ? 3.5 1.7 ? 19511 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.7 2.85 90.4 ? ? ? 1.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 0.9724 ELETTRA 5.2R
Software
Software Name Purpose Version
XSCALE data scaling .
REFMAC refinement 5.8.0107
PDB_EXTRACT data extraction 3.27
iMOSFLM data reduction .
MOLREP phasing .