X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291.15 0.2 M Sodium fluoride, 0.1 M Bis-Tris propane pH 8.5, 20 % w/v PEG 3350 (H1 condition, PACT premier plate)
Unit Cell:
a: 38.970 Å b: 41.830 Å c: 63.330 Å α: 93.250° β: 99.860° γ: 114.950°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.89 Solvent Content: 37.94
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.30 34.50 83634 4182 96.13 0.1437 0.1774 29.31
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.3 34.5 96.16 0.076 ? 16.2 9.1 ? 83670 ? ? 14.84
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.30 1.35 92.1 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.978 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
PHENIX refinement 1.18.2_3874
PHASER phasing .
XSCALE data scaling .
Aimless data reduction .