X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298 4 % PEG 4K, 7 % glycerol, 30 mM MgCl2, 30 mM CaCl2, 5 mM L-tyrosine and 100 mM MES/Imidazole pH 6.5
Unit Cell:
a: 104.642 Å b: 157.838 Å c: 180.350 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS FREE R-VALUE 2.20 47.88 149600 7480 98.61 0.1793 0.2123 71.42
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 47.88 98.64 0.0789 ? 24.50 13.2 ? 149600 ? ? 51.82
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.279 93.26 ? ? 1.09 10.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.99999 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.18.2_3874
REFMAC refinement 5.8.0258
XDS data processing Jan 31, 2020
PHENIX phasing .
XSCALE data scaling .
XDS data reduction .