X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 1.25M (NH4)2SO4, 0.1M cacodylate pH 6.5, 10 mM Tris pH 7, 14.4 TP buffer
Unit Cell:
a: 31.773 Å b: 56.655 Å c: 60.597 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.86 Solvent Content: 33.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.15 30.2980 39365 1973 98.7000 0.1623 0.1927 16.5800
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.150 41.384 98.700 0.084 ? 10.040 6.35 ? 39372 ? -3.000 12.310
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.150 1.220 95.100 ? ? 1.750 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 2 0.980119943619 SOLEIL PROXIMA 2
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.4.0
PHENIX refinement 1.10
PDB_EXTRACT data extraction 3.20
XDS data reduction .