X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 294 1.2 M Ammonium sulfate, 0.25 PEG3350, 0.1 M MES
Unit Cell:
a: 105.798 Å b: 105.798 Å c: 191.516 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 2 2
Crystal Properties:
Matthew's Coefficient: 3.0 Solvent Content: 59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.6100 48.59 32234 1661 99.7800 0.1975 0.2373 40.4790
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.610 48.61 99.800 0.263 ? 8.300 8.000 ? 33957 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.610 2.720 98.800 ? ? ? 7.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE BRUKER AXS MICROSTAR-H 1.5418 ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.8.0258
XDS data reduction .
Aimless data scaling 0.7.3
PDB_EXTRACT data extraction 3.25
PHASER phasing .