7AHV

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 2 M ammonium sulphate, 0.1 M Hepes, pH 7.5
Unit Cell:
a: 97.030 Å b: 97.030 Å c: 254.510 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 2 2
Crystal Properties:
Matthew's Coefficient: 3.73 Solvent Content: 67.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.11 48.52 22787 549 99.85 0.2283 0.2835 42.89
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.105 48.52 99.80 0.692 ? 4.30 13.0 ? 22811 ? ? 50.79
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.105 3.216 99.19 ? ? 0.95 13.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.0000 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement dev_3965
XDS data reduction .
XSCALE data scaling .
MOLREP phasing .