X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 295 Buffer 0.1M bicine/Trizma Base pH 8.5 0.03M Sodium fluoride; 0.03M Sodium bromide; 0.03M Sodium iodide 12.5% w/v PEG 1000, 12.5% w/v PEG 3350, 12.5% v/v MPD
Unit Cell:
a: 81.250 Å b: 81.250 Å c: 59.060 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3
Crystal Properties:
Matthew's Coefficient: 3.10 Solvent Content: 60.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.91 30.24 10644 569 99.5 ? 0.219 41.77
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.910 40.620 99.5 0.12900 ? 11.1000 9.700 ? 11214 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.91 1.96 99.4 ? ? 1.500 10.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.9762, 1.741, 1.738, 1.698 Diamond I03
Software
Software Name Purpose Version
REFMAC refinement 5.8.0258
xia2 data scaling 3ii
SHELXDE phasing 2013/2
PDB_EXTRACT data extraction 3.25
xia2 data reduction 3ii