X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 200 mM (Li)2SO4 100 mM Tris pH 8.5 40 % PEG 400
Unit Cell:
a: 48.245 Å b: 61.556 Å c: 93.098 Å α: 90.000° β: 97.410° γ: 90.000°
Symmetry:
Space Group: I 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.70 Solvent Content: 54.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.1000 40.4020 108725 5483 99.4800 0.1235 0.1424 20.0662
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 44.910 99.600 0.029 ? 16.700 3.600 ? 108890 ? ? 12.850
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.100 1.120 99.700 ? ? ? 3.400 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1 ELETTRA 5.2R
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.5.32
PHASER phasing 2.7.16
PHENIX refinement 1.11
PDB_EXTRACT data extraction 3.24
Feedback Form
Name
Email
Institute
Feedback