X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 290.15 0.1 M HEPES, 10% PEG 8000, 8% ETHYLENE GLYCOL, PH 7.5
Unit Cell:
a: 150.850 Å b: 61.860 Å c: 142.420 Å α: 90.000° β: 117.935° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.130 Solvent Content: 42.330
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.26048715056 125.82516793 52990 2659 96.9004297339 0.17478859218 0.239891031969 32.0203616284
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.260 125.830 96.800 0.138 ? 5.640 2.861 ? 53012 ? ? 26.1577580225
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.260 2.320 98.900 ? ? 2.350 2.906 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80.000 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-2 0.899998 ESRF ID23-2
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
PHENIX refinement 1.11.1_2575
XDS data reduction .
XSCALE data scaling .
PHASER phasing 2.8.3
PDB_EXTRACT data extraction 3.25
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