X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 289 Morpheus 1-2 (0.06 M Divalents: 0.3M Magnesium chloride hexahydrate; 0.3M Calcium chloride dehydrate; 0.1 M Buffer System 1: 1.0M Imidazole; MES monohydrate pH 6.5, 50% v/v Precipitant Mix 2: 40% v/v Ethylene glycol; 20% w/v PEG 8000) protein conc. 13-28mg/ml
Unit Cell:
a: 121.327 Å b: 70.201 Å c: 51.260 Å α: 90.000° β: 103.546° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.76 Solvent Content: 55.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.50 43.41 63399 3170 94.84 0.1802 0.2081 23.91
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 43.41 94.83 0.056 ? 12.17 3.2 ? 63441 ? ? 19.11
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.5 1.554 74 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1.0396 ELETTRA 5.2R
Software
Software Name Purpose Version
PHENIX refinement 1.16_3549
PHENIX refinement 1.16_3549
XDS data reduction .
XDS data scaling .
AutoSol phasing .
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