X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 3.5 M sodium formate, 0.1 M BIS-TRIS, pH 7.0
Unit Cell:
a: 134.835 Å b: 14.113 Å c: 24.568 Å α: 90.000° β: 90.350° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.74 Solvent Content: 29.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.3700 33.7100 9539 463 93.3700 0.1582 0.1774 14.0822
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.370 33.710 93.500 0.149 ? 8.700 11.200 ? 9559 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.370 1.410 59.500 ? ? ? 6.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.033 APS 23-ID-B
Software
Software Name Purpose Version
xia2 data reduction 0.5.893-gb176367e-dials-1.14
DIALS data reduction 1.14.5-g19190e3b9-release
Aimless data scaling 0.7.4
PHASER phasing 2.8.3
PHENIX refinement 1.17.1_3660
PDB_EXTRACT data extraction 3.25