ELECTRON MICROSCOPY

Sample

Export apparatus core, inner rod and start of the needle of the Shigella type 3 secretion system

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details Sample applied on grid 5 ul, incubation time 5 min on ice, then moved into Vitrobot and 5 ul sample applied again. Blot time: 2 sec Blot force: -2 Drain time: 0 sec
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 72298
Reported Resolution (Å) 5.11
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol ?
Refinement Target Cross-correlation coefficient
Overall B Value 162
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON II (4k x 4k)
Electron Dose (electrons/Å2) 25
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1.5
Maximum Defocus (nm) 4
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 101179
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION 1.4
CTF CORRECTION CTFFIND 3.5
MODEL FITTING UCSF Chimera 1.13.1
MODEL FITTING iMODFIT 1.44
INITIAL EULER ASSIGNMENT RELION 2.1
FINAL EULER ASSIGNMENT RELION 2.1
CLASSIFICATION RELION 2.1
RECONSTRUCTION RELION 2.1
MODEL REFINEMENT PHENIX 3409
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?