X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.15 293 13.5% PEG3350 0.2 M Na2HPO4 pH 8.15 Protein sample buffer: 20 mM citrate pH 6.0 10 mM CoASH 50 mM Mg.ADP
Unit Cell:
a: 150.364 Å b: 154.011 Å c: 154.087 Å α: 91.53° β: 110.04° γ: 107.46°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.41 Solvent Content: 63.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.30 48.46 176285 8667 95.6 0.157 0.187 127.40
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.30 48.46 95.4 ? ? 8.38 7.5 1319341 176777 ? ? 105.25
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.30 3.38 95.7 ? ? 0.77 7.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.999977 SLS X06SA
Software
Software Name Purpose Version
BUSTER refinement 2.10.2
XDS data reduction .
Aimless data scaling .
PHASER phasing .
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