X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1 M MES pH 6.0, 1.0 M lithium chloride, 20% (m/v) PEG 6000
Unit Cell:
a: 44.150 Å b: 47.340 Å c: 78.470 Å α: 97.667° β: 90.193° γ: 113.538°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.40 40.40 99379 4970 87.54 0.1630 0.1800 16.92
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.40 50.0 87.5 0.026 ? 17.82 1.91 ? 99388 ? ? 13.43
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.40 1.50 66.7 ? ? 5.57 1.81 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.999878 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.15.2_3472
XDS data reduction .
XSCALE data scaling .
PHASER phasing .