X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.02 M xylitol 0.02 M myo-inositol 0.02 M D-(-)-fructose 0.02 M L-rhamnose monohydrate 0.02 M D-sorbitol 0.1 M BES/Triethanolamine pH 7.5 12.5 % PEG4000 20 % 1,2,6-hexanetriol
Unit Cell:
a: 73.531 Å b: 154.373 Å c: 276.054 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 3.36 Solvent Content: 63.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.121 79.04 88580 4490 99.2 0.1866 0.2034 103.91
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.12 139 99.2 ? ? 18.58 13.6 ? 88579 ? ? 44.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.12 2.25 96.5 ? ? 0.92 11.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) 0.976245 PETRA III, EMBL c/o DESY P14 (MX2)
Software
Software Name Purpose Version
BUSTER refinement 2.10.3
XDS data reduction 20200131
Aimless data scaling 0.7.4
PHASER phasing 2.8.3