X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 292 1.6 M ammonium sulfate, 10% (v/v) 1,4-dioxane
Unit Cell:
a: 256.750 Å b: 256.750 Å c: 256.750 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41 3 2
Crystal Properties:
Matthew's Coefficient: 5.36 Solvent Content: 77.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 3.2110 46.8760 23774 2351 99.7400 0.2623 0.2989 85.5947
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.210 46.880 99.800 0.171 ? 8.200 7.300 ? 23799 ? ? 100.670
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.210 3.320 100.000 ? ? ? 7.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97903 ESRF ID29
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.1
SHELXDE phasing .
PHENIX refinement 1.18
PDB_EXTRACT data extraction 3.24