X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1 M Na/K-PO4, pH 6.5, 35 % MPD
Unit Cell:
a: 90.349 Å b: 94.560 Å c: 94.781 Å α: 98.47° β: 111.71° γ: 97.42°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.93 Solvent Content: 57.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.96 49.55 176747 9068 91.63 0.23118 0.25956 39.379
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.96 49.55 91.6 0.138 ? 4.7 3.7 ? 185831 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.96 1.99 93.2 ? ? 0.4 3.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.976251 ESRF ID30B
Software
Software Name Purpose Version
REFMAC refinement 5.8.0222
XDS data reduction .
XDS data scaling .
PHASER phasing .
Coot model building .