X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 HEPES-NaOH, sodium formate, PEG 3350, glycerol
Unit Cell:
a: 77.848 Å b: 83.985 Å c: 86.939 Å α: 65.380° β: 89.770° γ: 64.560°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.93 Solvent Content: 68.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.6000 45.0460 53651 2689 98.7200 0.2120 0.2330 81.2031
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.600 46.620 98.800 0.079 ? 11.100 6.200 ? 53681 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.600 2.680 98.200 ? ? ? 6.000 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9999 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement 1.16_3549
Aimless data scaling 0.5.8
PDB_EXTRACT data extraction 3.25
XDS data reduction VERSION Oct 15, 2015 BUILT=20151231
PHENIX phasing 1.16_3549