6XR4

ELECTRON MICROSCOPY

Sample

HEK293 cell

Specimen Preperation
Sample Aggregation State CELL
Vitrification Instrument ?
Cryogen Name ETHANE-PROPANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SUBTOMOGRAM AVERAGING
Number of Particles 4307
Reported Resolution (Å) 14
Resolution Method FSC 0.143 CUT-OFF
Other Details Each model in the conformation ensemble represents a cluster. Models are arranged sequentially from lowest to highest cluster RMSD. Model 1 is the best representative model. Model-Cluster correpondence is as follows: Model 1 = Cluster 20 Model 2 = Cluster 16 Model 3 = Cluster 24 Model 4 = Cluster 32 Model 5 = Cluster 14 Model 6 = Cluster 1 Model 7 = Cluster 44 Model 8 = Cluster 11 Model 9 = Cluster 3 Model 10 = Cluster 22 Model 11 = Cluster 4 Model 12 = Cluster 12 Model 13 = Cluster 19 Model 14 = Cluster 7 Model 15 = Cluster 31 Model 16 = Cluster 26 Model 17 = Cluster 52 Model 18 = Cluster 2 Model 19 = Cluster 45 Model 20 = Cluster 8 Model 21 = Cluster 5 Model 22 = Cluster 23 Model 23 = Cluster 42 Model 24 = Cluster 25 Model 25 = Cluster 43 Model 26 = Cluster 27 Model 27 = Cluster 39 Model 28 = Cluster 6 Model 29 = Cluster 13 Model 30 = Cluster 28 Model 31 = Cluster 21 Model 32 = Cluster 10 Model 33 = Cluster 53 Model 34 = Cluster 30 Model 35 = Cluster 35 Model 36 = Cluster 38 Model 37 = Cluster 33 Model 38 = Cluster 40 Model 39 = Cluster 37 Model 40 = Cluster 29 Model 41 = Cluster 51 Model 42 = Cluster 41 Model 43 = Cluster 15 Model 44 = Cluster 9 Model 45 = Cluster 17 Model 46 = Cluster 50 Model 47 = Cluster 48 Model 48 = Cluster 49 Model 49 = Cluster 18 Model 50 = Cluster 46 Model 51 = Cluster 36 Model 52 = Cluster 47 Model 53 = Cluster 34
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol OTHER
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 2
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI POLARA 300
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION SerialEM ?
MODEL FITTING IMP ?
MODEL REFINEMENT IMP ?
RECONSTRUCTION RELION ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING ONLY ?