ELECTRON MICROSCOPY

Sample

FUS low complexity sequence

Specimen Preperation
Sample Aggregation State HELICAL ARRAY
Vitrification Instrument LEICA PLUNGER
Cryogen Name ETHANE
Sample Vitrification Details Preblot for 10 seconds and blot for 5 seconds before plunging
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 275520
Reported Resolution (Å) 2.62
Resolution Method FSC 0.143 CUT-OFF
Other Details 3D refinement and post-processing were performed with 21 (screw) symmetry
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol OTHER
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details Manually generated model was fit into the density using PHENIX and UCSF Chimera. Further refinements were performed using Xplor-NIH.
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 47
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 2500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 130000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION 3.0
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION RELION 3.0
MODEL FITTING Coot ?
INITIAL EULER ASSIGNMENT RELION 3.0
FINAL EULER ASSIGNMENT RELION 3.0
CLASSIFICATION RELION 3.0
RECONSTRUCTION RELION 3.0
MODEL REFINEMENT PHENIX ?
MODEL REFINEMENT UCSF Chimera ?
MODEL REFINEMENT X-PLOR Xplor-NIH
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE Gctf