X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 100 mM sodium acetate, 35-39% PEG-400
Unit Cell:
a: 127.234 Å b: 127.192 Å c: 127.151 Å α: 124.813° β: 102.390° γ: 102.385°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.42 Solvent Content: 63.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.90 38.31 422034 2037 92.33 0.1864 0.2083 28.29
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 38.31 92.3 ? ? 19.5 3.7 ? 422103 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.93 90.0 ? ? 1.3 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97930 APS 24-ID-C
Software
Software Name Purpose Version
PHENIX refinement 1.18.2_3874
XDS data reduction .
Aimless data scaling .
AutoSol phasing .
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