X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 1.2 M Sodium dihydrogen phosphate/0.8 M dipotassium hydrogen phosphate, 0.2 M Lithium sulfate, 0.1 M CAPS pH 10.5
Unit Cell:
a: 82.770 Å b: 101.100 Å c: 104.330 Å α: 98.800° β: 112.360° γ: 106.720°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.73 Solvent Content: 67.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4200 38.9100 107350 5428 98.4000 0.2076 0.2345 31.6800
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 38.91 98.9 ? ? 2.85 1.97 ? 114511 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.47 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97915 APS 24-ID-E
Software
Software Name Purpose Version
BUSTER refinement 2.10.2
PDB_EXTRACT data extraction 3.25
XDS data reduction .
Aimless data scaling .
PHASER phasing .