X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 291 20% (w/v) PEG 3350 and 8% (v/v) Tacsimate pH 7.0
Unit Cell:
a: 40.122 Å b: 51.190 Å c: 55.447 Å α: 68.228° β: 89.119° γ: 69.079°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.41 Solvent Content: 48.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.750 51.005 35093 1737 91.722 ? 0.2266 34.874
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.670 51.020 91.400 0.033 ? 11.600 2.000 ? 40219 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.670 1.700 88.500 ? ? ? 1.800 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97900 APS 24-ID-E
Software
Software Name Purpose Version
Aimless data scaling 0.7.4
REFMAC refinement 5.8.0258
PDB_EXTRACT data extraction 3.25
XDS data reduction .
PHASER phasing .