6WC3

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 295 0.1 M sodium citrate, pH 6.0, 0.725 M ammonium sulfate, 1 mM dithiothreitol, cryoprotected with 30% (v/v) glycerol
Unit Cell:
a: 133.275 Å b: 133.275 Å c: 288.470 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 4.39 Solvent Content: 72.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.2030 28.2940 25525 2000 99.2900 0.2132 0.2482 79.4855
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.200 29.260 99.000 0.132 ? 27.600 26.000 ? 25597 ? ? 85.280
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.200 3.280 88.400 ? ? ? 21.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-1 0.97930 NSLS-II 17-ID-1
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.5.31
PHASER phasing 2.5.5
PHENIX refinement 1.13.2998
PDB_EXTRACT data extraction 3.25