X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.25 M NaCl, 16% w/v PEG 3350, 10 mM MnCl2, 6 mM AMP-PNP, and 50 mM Acarbose
Unit Cell:
a: 47.545 Å b: 50.268 Å c: 127.794 Å α: 89.060° β: 80.180° γ: 71.810°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4400 28.5320 40153 2031 97.4200 0.1900 0.2498 32.4481
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.440 28.533 97.300 0.136 ? 5.600 2.400 ? 40165 ? ? 31.290
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.440 2.500 92.400 ? ? ? 2.400 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-1 0.9201 NSLS-II 17-ID-1
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.5.21
PHASER phasing .
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.25
Coot model building .
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