ISDA: 6W6A

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	287	StmaA.01536.a.B1.PW38756 at 11.4 mg/mL with 3 mM PLP against Morpheus screen condition E1: 10% PEG 20,000, 20% PEG 550 MME, 0.1 M MES/imidazole pH 6.5, 0.03 M each glycol (diethyleneglycol, triethyleneglycol, tetraethyleneglycol, pentaethyleneglycol)

Unit Cell:

a: 186.780 Å b: 57.470 Å c: 71.770 Å α: 90.000° β: 102.400° γ: 90.000°

Symmetry:

Space Group: C 1 2 1

Crystal Properties:

Matthew's Coefficient: 3.45 Solvent Content: 64.4

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.4500	45.6100	27392	1970	99.0100	0.1979	0.2335	65.4772

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.450	45.610	99.200	0.064	?	12.010	3.726	?	27465	?	?	54.360

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.450	2.510	98.800	?	?	2.340	3.845	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software