X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 298 Crystallization: 0.01 M Li2SO4 Monohydrate, 0.094 M Tris HCl, 30% PEG 4000 Cryoprotectant: 20% Glycerol
Unit Cell:
a: 37.300 Å b: 19.680 Å c: 40.810 Å α: 90.00° β: 93.26° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.75 Solvent Content: 29.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.25 37.24 16382 1633 97.5 0.192 0.227 16.20
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.25 37.24 97.47 0.115 ? 5.7 2.9 ? 16476 ? ? 8.83
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.25 1.295 96.44 ? ? 1.7 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-1 0.9198 NSLS-II 17-ID-1
Software
Software Name Purpose Version
PHENIX refinement 1.18RC2_3794
MOSFLM data reduction 7.2.2
Aimless data scaling 0.7.4
PHASER phasing 2.8.3
Coot model building 0.8.9.2 EL