ELECTRON MICROSCOPY

Sample

HemQ

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 129446
Reported Resolution (Å) 2.6
Resolution Method FSC 0.143 CUT-OFF
Other Details There is very strong preferred orientation that generates a number of problems, in addition to high level of aberrations.
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space RECIPROCAL
Refinement Protocol OTHER
Refinement Target REFMAC
Overall B Value ?
Fitting Procedure ?
Details COOT was crucial as well.
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 90
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS TALOS
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 3000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details The goal of the experiment was to show that it is possible to perform high resolution reconstruction in the presence of higher order aberrations.
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cisTEM ?
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION cisTEM ?
MODEL FITTING MOLREP ?
MODEL REFINEMENT REFMAC ?
INITIAL EULER ASSIGNMENT cisTEM ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?