ELECTRON MICROSCOPY

Sample

NEGATIVE STAIN MAP OF THE YEAST EXOCYST COMPLEX

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 67509
Reported Resolution (Å) 15
Resolution Method FSC 0.5 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 50.00
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 2000.00
Maximum Defocus (nm) 3000.00
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.70
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 22500
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
MODEL FITTING UCSF Chimera ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details