X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294 JCSG Core I Suite condition C9: 0.2M potassium thiocyanate, 20% (w/v) PEG3350
Unit Cell:
a: 139.020 Å b: 139.020 Å c: 170.570 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 3.64 Solvent Content: 66.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 2.4000 45.5050 38507 3696 99.2400 0.2121 0.2538 64.3017
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 45.505 99.700 0.154 ? 6.730 4.844 ? 38512 ? ? 57.329
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.460 99.400 ? ? 2.010 4.898 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.9791 APS 22-ID
Software
Software Name Purpose Version
XSCALE data scaling VERSION January 10, 2014 BUILT=20140307
PHENIX refinement 1.16_3549
PDB_EXTRACT data extraction 3.25
XDS data reduction VERSION January 10, 2014 BUILT=20140307
PHENIX phasing 1.8.4_1496