X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.3 293 50 mM magnesium chloride, 50 mM ammonium phosphate monobasic, 100 mM HEPES, pH 7.3, 20% PEG400
Unit Cell:
a: 164.271 Å b: 164.271 Å c: 123.388 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 42
Crystal Properties:
Matthew's Coefficient: 4.03 Solvent Content: 69.47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.8 49.3285577169 31442 1562 96.7356859367 0.256616776797 0.298207837322 54.2009467284
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.78 49.33 99.8 0.073 ? 38.9 13.4 ? 32522 ? ? 1.1227169137
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.8 3.87 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 1 APS 24-ID-C
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .