X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 2% PEG 4000, 100mM MES pH 6.0, 10mM magnesium sulfate
Unit Cell:
a: 166.702 Å b: 169.479 Å c: 102.766 Å α: 90.0° β: 90.0° γ: 90.0°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.75 Solvent Content: 55.24
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.59456090099 47.4573444442 41844 3363 80.4766006316 0.17995419765 0.233541891499 48.9837094387
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.59456 50.0 99.7 0.068 ? 16.5 4.0 ? 45025 ? ? 40.7332583871
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.64 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.97395 ALS 5.0.2
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
PHENIX refinement 1.9_1692
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .