X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 289 0.2M MgCl2, 0.1M Tris-HCl, pH8.5, 25% w/v PEG3,350 and cryo-protected in 20% ethylene glycol
Unit Cell:
a: 50.870 Å b: 52.750 Å c: 71.130 Å α: 71.00° β: 85.59° γ: 64.61°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.9 Solvent Content: 36.5
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.80 45.07 56688 2000 97.1 0.171 0.205 37.80
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.800 50.000 97.0 0.04800 ? 12.7400 2.900 ? 56702 ? -3.000 35.70
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.85 95.8 ? 2.290 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F
Software
Software Name Purpose Version
PHENIX refinement 1.17RC1_3602
XSCALE data scaling .
PDB_EXTRACT data extraction 3.22
XDS data reduction .
PHASER phasing .