X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 298 0.1 M Cadmium chloride, 0.1 M Sodium acetate pH 4.6, 30% PEG 400
Unit Cell:
a: 51.030 Å b: 51.030 Å c: 36.020 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 3 1 c
Crystal Properties:
Matthew's Coefficient: 1.53 Solvent Content: 19.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING THROUGHOUT 0.9000 25.5100 27581 3065 78.7300 0.1205 0.1429 7.1950
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.900 25.510 78.700 0.086 ? 5.850 2.242 ? 30646 ? ? 7.496
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.900 0.920 66.400 ? ? 2.160 2.388 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.77490 APS 24-ID-C
Software
Software Name Purpose Version
XDS data reduction 20190315
XSCALE data scaling 20190315
REFMAC refinement 5.8.0253
PDB_EXTRACT data extraction 3.25
SHELXD phasing SHELXT actually, but was not available on this menu