X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 0.09 M sodium nitrate, 0.09 M Sodium phosphate dibasic, 0.09 M ammonium sulfate, 0.1 M HEPES, 0.1M MOPS pH 7.5, 12.5% v/v MPD, 12.5% PEG 1000, 12.5% PEG 3350
Unit Cell:
a: 28.530 Å b: 29.960 Å c: 30.100 Å α: 109.499° β: 108.863° γ: 107.911°
Symmetry:
Space Group: P -1
Crystal Properties:
Matthew's Coefficient: 1.78 Solvent Content: 31.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.100 24.992 28587 2859 89.393 ? 0.2137 8.572
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 24.992 88.900 0.052 ? 6.920 3.511 ? 28588 ? ? 9.781
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.100 1.130 68.400 ? ? 3.580 3.122 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E
Software
Software Name Purpose Version
XDS data reduction 20190315
XSCALE data scaling 20190315
REFMAC refinement 5.8.0253
PDB_EXTRACT data extraction 3.25
SHELXD phasing .