X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 294 20-25 % PEG 3350, 0.1 M Bis-Tris, pH 6.5, 0.2 M Li2SO4, 10 mM MgCl2, 1 mM Spermine
Unit Cell:
a: 42.230 Å b: 93.980 Å c: 179.630 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 2 21
Crystal Properties:
Matthew's Coefficient: 3.15 Solvent Content: 60.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.82 46.99 33032 3311 99.22 0.1950 0.2327 142.52
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.82 46.99 99.3 0.08 ? 15.2 13.0 ? 17899 ? ? 92.58
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.82 2.92 99.4 ? ? 1.2 10.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 A APS 22-ID
Software
Software Name Purpose Version
SERGUI data collection .
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
AutoSol phasing .
Coot model building .
PHENIX refinement 1.14_3260
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