ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.2	298	0.1 M phosphate/citrate pH 4.2, 40% (v/v) PEG 300

Unit Cell:

a: 32.720 Å b: 32.720 Å c: 25.440 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: H -3

Crystal Properties:

Matthew's Coefficient: 1.88 Solvent Content: 34.69

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	AB INITIO PHASING	FREE R-VALUE	0.80	16.36	10290	1019	96.01	0.1460	0.1483	15.27

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
0.800	18.93	96.100	0.056	?	18.880	5.695	?	10306	?	?	9.919

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	0.800	0.820	60.800	?	?	2.540	2.211	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 24-ID-C	0.8856	APS	24-ID-C

Software