X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.17 M ammonium sulfate, 25.5% (w/v) PEG 4000, 15% (v/v) glycerol
Unit Cell:
a: 12.200 Å b: 10.980 Å c: 25.540 Å α: 90.000° β: 114.903° γ: 90.000°
Symmetry:
Space Group: P 1 21/c 1
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 0.80 11.58 6183 619 97.32 0.0504 0.0518 1.70
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.800 11.583 97.100 0.079 ? 19.010 6.460 ? 6184 ? ? 4.617
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.800 0.820 93.600 ? ? 16.070 6.298 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.7293 APS 24-ID-C
Software
Software Name Purpose Version
XDS data reduction 20180126
XSCALE data scaling 20180126
PHENIX refinement 1.16_3549
PDB_EXTRACT data extraction 3.25
SHELXT phasing .