X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 298 0.2 M lithium sulfate, 0.1 M sodium acetate, pH 4.5, 50% (w/v) PEG 400
Unit Cell:
a: 14.010 Å b: 15.480 Å c: 18.720 Å α: 105.148° β: 99.957° γ: 99.472°
Symmetry:
Space Group: P -1
Crystal Properties:
Matthew's Coefficient: 1.55 Solvent Content: 20.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.10 12.10 5277 528 89.70 0.1111 0.1127 4.32
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 17.6 89.600 0.107 ? 4.780 3.528 ? 5289 ? ? 7.996
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.100 1.130 72.400 ? ? 4.150 3.113 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.9792 APS 24-ID-E
Software
Software Name Purpose Version
XDS data reduction 20180126
XSCALE data scaling 20180126
PHENIX refinement v1.16
PDB_EXTRACT data extraction 3.25
SHELXD phasing 2013/2